| Customization: | Available |
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| After-sales Service: | Online Technical Support |
| Application: | Laboratory Apparatus |
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Characteristic X-radiation of element
| Element | Content(%) | Element | Contenl(%) |
| Cr | 0.001 | Fe | 0.001 |
| Ru | 2.011 | Ni | 0.218 |
| Rh | 13.25 | Co | 0.011 |
| Pd | 10.125 | Cu | 0.207 |
| Ag | 0.781 | Zn | 0.221 |
| Ir | 3.104 | Au | 2.302 |
| Pt | 77.816 | In | 2.011 |
| Measurement precision | 0.05%(≥96%) |
| Analysis range | 1ppm-99.99% |
| Analytical range of elements | More than 60 elements from potassium (K) to uranium (U) |
| Measuring object | powder, solid and liquid |
| Measurement time | (60~300)s |
| Ambient temperature range | (15-30)t) |
| Relative humidity | W70% |
| Weight | 30kg |
| Working voltage | AC 110V/220V |
Configuration |
Single sample chamber |
| Si PIN semiconductor detector | |
| Amplifier circuit | |
| High and low voltage power supplies | |
| X-ray tube | |
| Non-vacuum chamber |
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