Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer

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Customization: Available
After-sales Service: Online Technical Support
Application: Laboratory Apparatus
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Export Year
2014-03-18
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
  • Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
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  • Overview
  • Product Feature
  • Technical Specification
  • Detailed Photos
  • Company Profile
  • FAQ
Overview

Basic Info.

Model NO.
DW-NP-5010
Warranty
1 Year
Detection Method
Spectrophotometer
Advantage
High Sensitive
Principle
Classic Spectrometer
Wavelengths
UV Spectrometer
Dispersive Element
Interferometer Spectrometer
Light Number
Monochromator
Certification
CE
Customized
Customized
Analysis Principle
Energy Dispersive X-ray Fluorescence Analysis
Element Measuring Range
Any Element From Na(11)-U(92)
Min. Measuring Limit
CD/Hg/Br/Cr/Pb≤2 Ppm
Sample Shape
Arbitrary Size, Any Irregular Shape
Sample Type
Plastic/Metal/Film/Powder/Liquid etc
Target
Mo
Sample Exposure Diameter
2, 5, 8mm
Detector
Si-Pin or Sdd Detector
High Voltage Generator
Special Hv Generator for X Fluorescence
ADC
2048 Channels
Filter
6 Filters Are Automatically Selected and Converted
Transport Package
Standard English Package
Specification
66*58*62cm
Trademark
Drawell
Origin
China
HS Code
8419200000
Production Capacity
20pieces/Month

Product Description

DW-NP-5010 Energy Metal Analyzer Metal Analysis X-ray Fluorescence Spectrometer XRF
Product Feature
Introduction
DW-NP-5010A energy dispersive XRFhas very wide application. It can do qualitative, quantitative and no sample analysis. Such as block sample, powder or liquid samples, from the 4th element in the periodic table beryllium (Be) to the 92rd element uranium (U), almost all of the elements can be accurately analyzed. The analytical concentration range can be from 0.1 PPM to 100%, and even up to 100% of the elementconcentration can be directly measured without dilution.XRF analysis method has the advantages of simple sample preparation, wide determination range of elements, high determination accuracy, good reproducibility, fast measurement speed (30s-900s), no environmental pollution and no destruction of samples.

Main component and technical parameters

1. Si(PIN) or SDD detector
The resolution of detector is one of the main indexes to evaluate the performance of energy dispersive XRF spectrometer.
Resolution<  145eV (The lower the resolution, the higher the sensitivity.)
Counting rate>  1000/S
Crystal area>  15mm2
Beryllium window thickness  =  0.025mm
Detector power<  1.2W
2.  Multi-channel analyzer
Number of channels: 2048 channels

3. Power controllerSystem power control: +5 VDC at 250 mA (1.2 W)
Constant cooling control: 400 VDC
4.  X ray tube
The X-ray tube, specially treated with embedded lead inside is shielded in full range, leaving only the side window for the x ray outlet. The canned insulating oil is used for high voltage insulation and cooling, 0.005 inch Beryllium window, rated consumption power 50W, rated power 50kV. Designed service life >15000h.
5.  High voltage generator
Input:  85~265VAC,47~63Hz,Power factor correction.
1kV~5kVcomply to UL85~250VAC input standard
Voltage variation: 0.01% of output voltage from no load to full load
Current variation: 0~rated power, 0.01% of output current
Ripple: Peak - peak of output voltage 0.25%
Temperature variation: voltage or current setting, 0.01%/oC
Stability: 0.05%/8h after warming-up for half an hour
6.  Automatic filter conversion system
Filters are automatically selected and converted(filter function:The energy spectrum component of the excitation line can be improved to suppress the strong X-ray fluorescence of high content components and improve the measurement accuracy of the elements to be measured.)

 
Technical Specification
 
Model DW-NP-5010A
Analysis principle Energy dispersive X-ray fluorescence analysis
Element measuring range Any element from Na(11)-U(92)
Min. measuring limit Cd/Hg/Br/Cr/Pb≤2 ppm
Sample shape Arbitrary size, any irregular shape
Sample type Plastic/metal/film/powder/liquid etc
X ray tube Target material Mo
Tube voltage 5─50KV
Tube current 1─1000uA
Sample exposure diameter 2, 5, 8mm
Detector Si-PIN or SDD detector, high speed pulse height analysis system
High voltage generator Special HV generator for X fluorescence
ADC 2048 channels
Filter 6 filters are automatically selected and converted.
Sample observation 200×color CCDcamera
Analysis software Patented software products, free upgrade for life
Analysis method Theoretical α coefficient method,basic parameter method, empirical coefficient method
Analysis time 30-900seconds, adjustable
Operating system software WINDOWS XP
Dataprocessing system Host PC business model
CPU ≥2.8G
Memory ≥2g
CD-ROM 8xDVD
Hard disk ≥500G
Display 22'' or 24'' LCD display
Working environment Temperature 10-35С,humidity 30-70%RH
Detailed Photos

Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence SpectrometerBest Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence SpectrometerBest Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence SpectrometerBest Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence SpectrometerBest Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer

Company Profile

 

Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence SpectrometerBest Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer
FAQ
Best Prices Energy Metal Analyzer Metal Analysis X-ray Xrf Analyzer Fluorescence Spectrometer

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