Benchtop Powder X-ray Diffraction Xrd Instrument Lab Instrument Xrd Analyzer Spectrometer

• Customization: Available
• After-sales Service: Online Instruction; Real-Time Support
• Application: Laboratory Apparatus
• Model NO.: DW-XRD-Y3000
• Warranty: 1 Year
• Detection Method: Spectrophotometer
• Advantage: High Sensitive
• Principle: New Spectrometer
• Customized: Non-Customized
• Transport Package: Standard Package
• Trademark: Drawell
• Origin: China
• Production Capacity: 200 Piece Per Year

Product Description

DW-XRD-Y3000 Model X-ray diffraction instrument

 

Product Description

Y3000 Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of

conventional analysis with special-purpose measurement products.
•The perfect combination of hardware and software systems meets the needs of academics and researchers in different
application areas.

• High precision diffraction angle measurement system obtains more accurate results
• High stability of the X-ray generator control system gets more stable repeatability precision
• Programmable operation, integrated structure design, easy operation, elegant outlook.

X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:

• Unkown samples in a variety of phase identification
• Mixed samples with known quantitative phase analysis
• Crystal structure analysis
• Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)

•Analysis on material surface film
•Analysis on metal material texture and stress
Technique parameter

Rated power	3kW
Tube voltage	10-60kV
Tube current	5-80mA
X-ray tuble	glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW
Focus size	1 x 10mm or 0.4 x 14mm or 2 x 12mm
Stability	≤0.01%
Goniometer structure	Horizontal ( θ-2 θ)
Radius of diffraction	185mm
Scanning range	0-164
Scanning speed	0.0012° - 70° min
Max. revolving speed	100° /min
Scanning fashion	θ-2θ linkage, θ,2θ single action; continuous or stepping scanning
Angle repeatable accuracy	1/1000°
Minimal stepping angle	1/1000°
Detector	proportional counters(PC) or scintillation counters(SC)
Counting rate of linearity	5 x 10^5CPS ( with the compensate function of drop out counting )
Energy resolution ratio	≤25% (PC),≤50% (SC)
Counting fashion	differential coefficient or integral, PHA automatically, Dead time regulate
Stability of system measure	≤0.01%
Scattered rays dose	≤1 μ Sv/h ( without X-ray protective device )
Instrument integrative stability	≤0.5%
Figure size	1100 x 850 x 1750mm

  

Detailed Photos