Laboratory Metal Analysis Xrf Machine Price Desktop Xrf Analyzer Spectrophotometer

• After-sales Service: Provided
• Application: Laboratory Apparatus
• Warranty: 1 Year
• Shipping Cost: Estimated freight per unit.: about shipping cost and estimated delivery time.
• Currency: US$
• Return&refunds: You can apply for a refund up to 30 days after receipt of the products.
• Model NO.: DW-NP-5010
• Detection Method: Spectrophotometer
• Advantage: High Sensitive
• Principle: Classic Spectrometer
• Wavelengths: Visible Spectrometer
• Dispersive Element: Interferometer Spectrometer
• Light Number: Monochromator
• Certification: CE
• Customized: Non-Customized
• Number of Channels: 2048 Channels
• System Power Control: +5 VDC at 250 Ma (1.2 W)
• Constant Cooling Control: 400 VDC
• Voltage Variation: 0.01% of Output Voltage From No Load to Full Load
• Ripple: Peak - Peak of Output Voltage 0.25%
• Temperature Variation: Voltage or Current Setting, 0.01%/Oc
• Stability: 0.05%/8h After Warming-up for Half an Hour
• Detection Limit(CD/Pb/Cr/Hg/Br): 2ppm
• Transport Package: Standard Export Carton Packaging
• Trademark: Drawell
• Origin: China
• HS Code: 8419200000
• Production Capacity: 500PCS/Year

Product Description

Product Description

Energy Dispersion X-ray Fluorescence Spectrometer
(DW-NP-5010)

Working principle
The original X-ray produced by X-ray tube and high voltage is irradiated on the sample after being properly filtered by the optical filter. The characteristic X-ray (called X-ray fluorescence) of the elements contained in the sample is stimulated. X-ray fluorescence spectra were obtained by using X-ray detectors with high energy resolution. Different elements formed different spectral peaks on the spectra.The strength of the spectral peak is directly proportional to the content of elements in the sample. The energy spectrum detected by the detector is analyzed by the computer. The types of elements contained in the sample are qualitatively analyzed by the position and shape of the spectral peak.

Application
DW-NP-5010A energy dispersive X-ray fluorescence spectrometer (XRF) is widely used in environmental protection, geology, mineral, metallurgy, cement, electronics, petrochemical, polymer, food, medicine and high-tech materials and other fields, playing an important role in product research and development, production process monitoring and quality management.In addition, the instrument can be used in archaeology, building materials, RoHS directive and other industries. It is the enterprise quality control ideal choice.
 

Model			DW-NP-5010A
Analysis principle			Energy dispersive X-ray fluorescence analysis
Element measuring range			Any element from Na(11)-U(92)
Min. measuring limit			Cd/Hg/Br/Cr/Pb≤2 ppm
Sample shape			Arbitrary size, any irregular shape
Sample type			Plastic/metal/film/powder/liquid etc
X ray tube	Target material		Mo
	Tube voltage		5─50KV
	Tube current		1─1000uA
Sample exposure diameter			2, 5, 8mm
Detector			Si-PIN or SDD detector, high speed pulse height analysis system
High voltage generator			Special HV generator for X fluorescence
ADC			2048 channels
Filter			6 filters are automatically selected and converted.
Sample observation			200×color CCDcamera
Analysis software			Patented software products, free upgrade for life
Analysis method			Theoretical α coefficient method,basic parameter method, empirical coefficient method
Analysis time			30-900seconds, adjustable
Operating system software			WINDOWS XP
Dataprocessing system		Host	PC business model
		CPU	≥2.8G
		Memory	≥2g
		CD-ROM	8xDVD
		Hard disk	≥500G
		Display	22'' or 24'' LCD display
Working environment			Temperature 10-35С,humidity 30-70%RH

 

 

 

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