All Precious Metals in Gold Jewelries Desktop Gold/Metal/Alloy Xrf Analyzer Gold Testing Machine Spectrometer Laboratory Equipment

• After-sales Service: 1 Year Service
• Application: Laboratory Apparatus
• Warranty: 1 Year Service
• Shipping Cost: Estimated freight per unit.: about shipping cost and estimated delivery time.
• Currency: US$
• Return&refunds: You can apply for a refund up to 30 days after receipt of the products.
• Model NO.: DW-EDX-3000
• Detection Method: Spectrophotometer
• Advantage: High Sensitive
• Wavelengths: Infrared Spectrometer
• Certification: CE
• Measurement Precision: 0.05%(≥96%)
• Analysis Range: 1ppm-99.99%
• Analytical Range of Elements: Elements From Magnesium (Mg) to Uranium (U)] Can B
• Simultaneous Detector Elements: Simultaneous Analyze 40 Elements
• Microcomputer System: System Memory: 1g ; Extended Stored Maximum Suppor
• The Content Range: Ppm ~ 99.99%
• The Detection Time: 1-60 Seconds (One Second Report Results)
• Detector: Si Pin Semiconductor Detector
• Measuring Object: Powder, Solid and Liquid
• Measurement Time: (60~300)S
• Ambient Temperature Range: (15-30)T)
• Relative Humidity: W70%
• Transport Package: Paper Carton
• Trademark: DRAWELL
• Origin: China
• HS Code: 9027300090
• Production Capacity: 300 Piece/Month

Product Description

Product Description

Energy Dispersive X-Ray Fluorescence Spectrometer
(for all precious metals in gold jewelries)

Technical Specifications
 

Measurement precision	0.05%(≥96%)
Analysis range	1ppm-99.99%
Analytical range of elements	More than 60 elements from potassium (K) to uranium (U)
Measuring object	powder, solid and liquid
Measurement time	(60~300)s
Ambient temperature range	(15-30)t)
Relative humidity	W70%
Weight	30kg
Working voltage	AC 110V/220V
Configuration	Single sample chamber
	Si PIN semiconductor detector
	Amplifier circuit
	High and low voltage power supplies
	X-ray tube
	Non-vacuum chamber

Characteristic X-radiation of element
Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.
Scattering
It is the background of spectrum.



 

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