• Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
  • Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
  • Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
  • Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
  • Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
  • Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer

Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer

After-sales Service: 12 Months
Application: Laboratory Apparatus
Warranty: > 1Year
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Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer pictures & photos
Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
US $45,000-68,000 / Piece
Min. Order: 1 Piece
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Overview

Basic Info.

Model NO.
DW-Y3000
Detection Method
Spectrophotometer
Advantage
High Sensitive
Principle
Classic Spectrometer
Wavelengths
Infrared Spectrometer
Dispersive Element
Grating Spectrometer
Light Number
Monochromator
Certification
CE
Customized
Customized
Rated Power
3kw
Tube Voltage
10~60kv
Tube Current
5~80mA
Tube Voltage and Current Stability
≤0.01%
X-ray Tube
Cu Target/Focal Point 1×10mm2
Minimum Step Angle
0.001°
Continues Scan Speed
0.0012&Deg-70°min
Step Scanning Step Width Angle
0.005~165°
2θangle Measurement Range
≤0.005°
Base Line and Channel Width
0%~99%
Transport Package
Wooden Carton
Trademark
DRAWELL
Origin
China
HS Code
9022199090
Production Capacity
300 Piece/Month

Product Description

Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray DiffractometerMetal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer

Product Description
5.DW-3000 XRD Property and Technical Parameter
  •  High pressure generator(Adopting imported PLC control technology):
  1. Rated Power:3kW;
  2. Tube Voltage:10~60kV  It is automatically controlled by computer terminal(1kV/step);
  3. Tube Current:5~80mA  It is automatically controlled by computer terminal(1mA/step);
  4. Tube Voltage and Current Stability≤0.01%;
  5. Protection of over voltage, over current, over power, and low water level;
  6. X-Ray Tube:Cu target,Focal point 1×10mm2,Power 2.0kW; 
  7. Optical shutter switch is automatically controlled by computer terminal;
  8. Unibody structure cooling device, Cooling device is unibody structure, and the automatic temperature control system can indicate the water temperature of X-ray tube.
  •  Goniometer and Control (Horizontal type):
  1. Horizontal Type θ-2θ, diffraction circle radius 185mm; Rotation of goniometer is
controlled by stepping motor (forward or reverse, forward scan), drive mode (move individually or jointly ), scanning mode(continuous, stepping), scanning speed, it can do angle-auto correction, detect losing step and avoid lost motion;
  1. Minimum Step Angle: 0.001°
  2. Continues Scan Speed: 0.0012°-70°min
  3. Step scanning step width angle: 0.005~165°
  4. Angle measurement range:≤0.005°;
  5. Angle measurement range:0--164°
  6. Goniometer 2θangle uni-directional Repeatability 0.001°
  •   Recording and Controlling Unit and Detector:
  1. Closed scintillation counter
  2. Auto differential and integral conversion
  3. Base line and channel width: 0%~99%
  4. Continuous adjustable high voltage of detector : 0~2000V
  5. High voltage stability of detector: ≤0.01%
  6. Optional X-ray tube target material: Cr,Fe,Co,Cu,Mo
  7. Energy Spectrum Analysis (Cu,Kα Curve): ≤25%(PC),≤50%(SC)
  •   Overall Stability
System overall stability ≤0.3%;
  •   Outline Dimension
XRD host net Dimension:1100×950×1750mm
  •   X-ray protection up to national standard
  •  On-line control software
     The on-line control software can order the XRD system to do continuous scanning or step
scanning and data acquisition. The software can process the general diffraction data and manage the disk file. Data processing including peak seeking (automatic and manual), single peak integral intensity calculation, smoothing, peak shape amplification, multiple drawing, etc .
  •   Application software (English Interface)
8.1  Operation functions:
      Diffraction peak measurement, overlap scanning, net intensity measurement, timer counter, goniometer rotating, goniometer step forward and back, goniometer adjustment, 2θcalibration, tube current and tube voltage optical shutter controlling.
8.2  Data analysis and processing function:
8.2.1  Smoothing, background deduction, Kα2 Peeling, peak seeking(mark D value,θvalue, d,2θintensity, half-peak bandwidth, display all parameters and many representing methods of diffraction peak), changing sampling step, eliminating , eliminating miscellaneous peak and Interfering peak, d data and peak position correction.
8.2.2 Calculate integral area, integral breadth, half-peak bandwidth; Spectral graph comparison, map add and subtract, and map combination; Insert text at any location in the map; Two kinds of cursors (small vernier, large cursor);Multiple zoom function; Multiple coordinate modes (linear coordinates, logarithmic coordinates, square coordinates).
8.2.3  Peak amplification: user can make any multiple of any multiple of the map by the left and right keys of the mouse.
8.3   Qualitative analysis:
Automatic retrieval and manual retrieval can be performed. Automatic retrieval results include: card number, molecular formula, matching index, reliability factor, and K value. Semi-quantitative analysis and k-value analysis can be carried out.
8.4   Quantitative analysis:
The absorption coefficient of the two components is different with the standard addition method, internal standard method and N component absorption coefficient.
8.5   The crystallinity of the sub-peak method is calculated
The partial peak process can directly change the parameters of the sub-peak by the mouse, and the difference between the fitting spectrum and the measured spectrum can be seen intuitively.
8.6   It can do refinement of cell parameters.
8.7   Index.
8.8  Diffraction data calibration:
          Using standard diffraction data CARDS (1-54 groups), the original data of the measurement was deviated to correct and the instrument measurement error was eliminated.

DW-Y3000 XRD Configuration List
Part Element Unit Qty.


X-Ray High Voltage Generator
  1. 1505 High Voltage Transformer  
set 1
  1. DW-75kV High Voltage Cable
piece 1
  1. 9850 Control panel  
set 1
  1. 9820 High voltage control unit
1
  1. 9830 Control gate
1
  1. 9810 System Case
1
  1. 9840 Main power cable
piece 1
  1. X-ray tube 2kW Cu, Focus size 1×10mm²
piece 1
  1. 3306 Tube holder
set 1
  1. 9924 X-ray Protective cover
1


Angle Measuring System
  1. 3501 Goniometer  
set 1
  1. Goniometer layer board
1
  1. Powder sample plate with blind Holes
piece 20
  1. Powder sample plate with through holes
10
  1. Micronutrient powder sample board
10
  1. Zero setting sample piece, double-knife edge slit
piece 1
  1. Standard ruler, watch oil
piece 1
  1. Filter  Ni  
piece 1
  1. Slit
set 1

Recording and Controlling Unit
  1. 2013 Recording and controlling units
set 1
  1. CH132  Scintillation counter
set 1
  1. Counter cable
piece 1
  1. Stepping motor cable
2
  1. Interface cable
1
Circulating Water Cooling System
  1. DW-ZFB-3000 Cooling device
set 1
  1. 9509 Power cable  
piece 1
  1. Water pipe 6 meters
piece 2
  1. Water relay cable
piece 1

Computer
  1. INTEL Pentium G2030, RAM 2G ,500G Hard disk 19″LCD
set 1
  1. Canon LBP6018 Laser printer
1
System Control Program and Applicable Software
  1. Data collecting and processing software
piece 1
  1. Data analysis and processing software  
1
  1. Application software   
1
  1. Diffraction data card stock
1
Technical Material
  1. DW-Y3000 X-ray diffractometer user manual
piece 1
  1. DW-ZFB-3000 Cooling device user manual
1
Spare Parts
  1. ring rubber blanket
piece 4
  1. Fuse  2A   3A  6A
piece 10

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Company Profile

Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray DiffractometerMetal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer

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Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer

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From payment to delivery, we protect your trading.
Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer pictures & photos
Metal Testing Machine X Ray Diffraction Meter Drawell Crystal Structure Testing X-ray Diffractometer
US $45,000-68,000 / Piece
Min. Order: 1 Piece
Diamond Member Since 2020

Suppliers with verified business licenses

Secured Trading Service
Rating: 5.0/5
Manufacturer/Factory, Trading Company
Management System Certification
ISO 9001
Export Year
2014-03-18