• Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer
  • Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer
  • Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer
  • Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer
  • Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer
  • Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

After-sales Service: Provided
Warranty: 1 Year
Portable: Non Portable
Form: Desktop
Application: Industrial
Type: Industrial High-definition X-ray Detector
Samples:
US$ 54588/Piece 1 Piece(Min.Order)
| Request Sample
Customization:
Diamond Member Since 2020

Suppliers with verified business licenses

Rating: 5.0/5
Manufacturer/Factory, Trading Company
  • Overview
  • Product Description
  • Detailed Photos
  • Certifications
  • FAQ
Overview

Basic Info.

Model NO.
DW-XRD-2700A
Certification
CE
Customized
Non-Customized
Alarm Form
Display Alarm
Rated Power
3kw(Hf,Hv Control Technology)
Tube Voltage
10-60kv
Tube Current
5-50mA
Focus Size
1X10mm or 0.4X14mm or 2X12mm
Stability
<0.005%
Transport Package
Standard Export Wooden Packaging
Specification
1000*800*1600mm
Trademark
Drawell
Origin
China
HS Code
8419200000
Production Capacity
500PCS/Month

Product Description

Product Description
Combined Multifunctional XRD DW-XRD-2700A
 
 
Parameters
 
Product Name Combined Multi-functional X-ray Diffractometer
Model No. DW-XRD-2700A
Rated power 3kW(HF,HV control technology)
Tube voltage 10-60kV
Tube current 5-50mA
X-ray tube Metal ceramic tube / Target material: Cu, Fe, Co, Cr, Mo, etc / Power:2.4kW
Focus size 1x10mm  or  0.4x14mm   or  2x12mm
Stability ≤0.005%
Goniometer structure  Sample level (θ-θ) 
 Radius of diffraction   225mm(or custom by request:150-285mmrange) 
 2θ Scanning range   -6~160°(θs:-3~80°, θd:-3~80°) 
 Scanning speed   0.0012°-50°/min 
 Angle locating speed   1500°/min 
 Scanning fashion   θs/θd  dlinkage/single action;  continuous, stepping and Omg 
 Angle repeatable accuracy   1/10000° 
 2θ Angular linearity   International standard sample(Si,AI203),the angle deviation of all peak in full spectrum are not more than ±0.02° 
 Detector   Proportional counters(PC) or scintillation counter(SC),Silicon drift detector(SDD),High speed one-dimensional semiconductor array detector 
 Energy resolution ratio   ≤25%(PC,one-dimensional array),≤50%(SC),≤200eV(SDD) 
 Counting fashion   Differential coefficient or integral, PHA automatically, dead time regulate 
 Stability of system measure   ≤0.01% 
 Scattered rays dose   ≤1μSv/h (without X-ray protective device) 
 Instrument integrative stability   ≤0.1% 
 Figure size   1000 x 800 x 1600 
 
Detailed Photos
Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray DiffractometerCatalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray DiffractometerCatalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray DiffractometerCatalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

 

Certifications
 

Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

 

FAQ

Catalyst Metal Crystal Structure Analysis Laboratory Xrd X Ray Diffractometer

Send your message to this supplier

*From:
*To:
*Message:

Enter between 20 to 4,000 characters.

This is not what you are looking for? Post a Sourcing Request Now

You Might Also Like

Diamond Member Since 2020

Suppliers with verified business licenses

Rating: 5.0/5
Manufacturer/Factory, Trading Company
Management System Certification
ISO 9001
Export Year
2014-03-18